Calculate the angle at which second-order reflection will occur in an X-ray spectrometer when X-rays of wavelength 1.54 Å are diffracted by the atoms of a crystal, given that the interplanar distance is 4.04 Å.1 point10.9811.2022.4024.20
Question
Calculate the angle at which second-order reflection will occur in an X-ray spectrometer when X-rays of wavelength 1.54 Å are diffracted by the atoms of a crystal, given that the interplanar distance is 4.04 Å.1 point10.9811.2022.4024.20
Solution
To calculate the angle at which second-order reflection will occur in an X-ray spectrometer, we can use Bragg's Law, which states:
nλ = 2d sinθ
where: n is the order of reflection, λ is the wavelength of the X-ray, d is the interplanar distance, and θ is the angle of reflection.
We are given: n = 2 (since it's second-order reflection), λ = 1.54 Å, and d = 4.04 Å.
We need to solve for θ.
Rearranging Bragg's Law to solve for θ gives us:
θ = arcsin(nλ / 2d)
Substituting the given values into the equation gives us:
θ = arcsin((2 * 1.54 Å) / (2 * 4.04 Å))
Solving this will give us the angle θ.
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