Question 9Which is true regarding Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM)?1 pointAll use electron beam for imagingAll work under vacuum conditionsAll can detect features below 100nm
Question
Question 9Which is true regarding Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM)?1 pointAll use electron beam for imagingAll work under vacuum conditionsAll can detect features below 100nm
Solution
The statement "All use electron beam for imaging" is not true. While SEM and TEM use an electron beam for imaging, AFM uses a probe to scan over the surface of the sample and does not use an electron beam.
The statement "All work under vacuum conditions" is also not true. SEM and TEM require a high vacuum to operate because they use electron beams. However, AFM does not require a vacuum and can work in a variety of environments including air and liquid.
The statement "All can detect features below 100nm" is true. All three techniques, AFM, SEM and TEM, have the resolution to detect features below 100nm.
Similar Questions
.Question 1Which of the following statements is most correct about Atomic Force Microscopy (AFM)?1 pointAFM can visualize unfixed specimens in water or buffer.AFM moves a very sharp tip over the surface of the specimen to "feel" its shape.AFM can visualize protein bound to DNA molecules.
5. Regarding electron microscopy, which of the following description is correct?Group of answer choiceselectron microscopy uses a laser for illuminationtransmission electron microscopy (TEM) can be performed on live cellsscanning electron microscopy (SEM) can reveal ultrastructures within a cellelectron microscopy allows visualization of bacteriophages
Which of the following is not used as a tool for Nanotribology studies?a) Compound Microscopeb) AFM (Atomic Force Microscope)c) STM (Scanning Tunneling Microscope)d) SPM (Scanning Probe Microscope)
Question 7What is the medium gas inside the Scanning Electron Microscope (SEM)?
n electron microscope, electron gun and anode emit high _____ electron beam.
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